C - Chemistry – Metallurgy – 09 – K
Patent
C - Chemistry, Metallurgy
09
K
C09K 11/06 (2006.01) A61B 1/227 (2006.01) A61B 5/107 (2006.01) A61C 9/00 (2006.01) A61C 13/38 (2006.01) A61C 19/04 (2006.01) F17B 1/26 (2006.01) G01B 11/06 (2006.01) G01B 11/24 (2006.01) G01B 11/245 (2006.01) C01G 7/00 (2006.01)
Patent
CA 2730429
The attenuation and other optical properties of a medium are exploit-ed to measure a thickness of the medium between a sensor and a target surface. Dis-closed herein are various mediums, ar-rangements of hardware, and processing techniques that can be used to capture these thickness measurements and obtain three-dimensional images of the target sur-face in a variety of imaging contexts. This includes general techniques for imaging interior/concave surfaces as well as exteri-or/convex surfaces, as well as specific adaptations of these techniques to imaging ear canals, human dentition, and so forth.
L'atténuation et d'autres propriétés optiques d'un milieu sont exploitées de manière à mesurer une épaisseur du milieu entre un capteur et une surface cible. L'inventeur présente divers milieux, agencements matériels et techniques de traitement qui peuvent être utilisés pour procéder aux mesures d'épaisseur et obtenir des images tridimensionnelles de la surface cible dans divers contextes d'imagerie. Ceci inclut des techniques générales pour imager aussi bien des surfaces intérieures/concaves que de surfaces extérieures/convexes, ainsi que des adaptations spécifiques de ces techniques de façon à imager des conduits auditifs, une dentition humaine, etc.
Frigerio Federico
Hart Douglas P.
Marini Davide M.
Massachusetts Institute Of Technology
Smart & Biggar
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