Systems for the direct analysis of solid samples by atomic...

Details Systems for the direct analysis of solid samples by atomic... Systems for the direct analysis of solid samples by atomic...

G - Physics

01

N

358/9

G01N 21/67 (2006.01) G01J 3/443 (2006.01) G01J 3/28 (2006.01)

Patent

CA 1261486

ABSTRACT An analysis system for directly analysing solid samples by atomic emission spectroscopy is provided wherein the system includes an atomic spectral lamp (1) of the type which enables the solid sample (33) to be analysed to be demountably located as a cathode of the lamp (1), the system also includes means (2) for producing a primary electric discharge by cathodic sputtering from the sample (33) and a secondary boosted discharge for analytical emmission, spectral wave length analysis devices (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and lamp control means including controlling the sputtering current level and the operation of the spectral wave length analysis devices (4) on the basis of output from the devices (4) such that the relation between spectral line intensity and concentration of the element in the sample (33) is maintained in a region which is substantially linear.

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