Tandem ion trapping arrangement

Details Tandem ion trapping arrangement Tandem ion trapping arrangement

H - Electricity

01

J

H01J 49/00 (2006.01) H01J 49/42 (2006.01)

Patent

CA 2696513

A mass spectrometer is disclosed comprising a first storage ion trap (2) arranged upstream of a high performance analytical ion trap (3). According to an embodiment ions are simultaneously scanned from both the first and second ion trap (2, 3). At any instant in time the quantity of charge present within the second ion trap (3) is limited or restricted so that the second ion trap (3) does not suffer from space charge saturation effects and hence the performance of the second ion trap (3) is not degraded.

L'invention concerne un spectromètre de masse comprenant un premier piège (2) à ions de stockage, positionné en amont d'un piège (3) à ions analytique haute performance. Selon un mode de réalisation, les ions sont balayés simultanément par le premier et le second piège (2, 3 ) à ions. A n'importe quel moment, la quantité de charge présente dans le second piège (3) à ions est limitée ou restreinte de manière que le second piège (3) à ions ne souffre pas des effets de saturation spatiale de la charge, l'efficacité du second piège (3) à ions n'étant ainsi pas réduite.

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