G - Physics – 01 – R
Patent
G - Physics
01
R
324/58.2
G01R 31/00 (2006.01) G01R 31/02 (2006.01) G08B 29/14 (2006.01)
Patent
CA 1050116
TAMPER TEST TECHNIQUE ABSTRACT OF THE DISCLOSURE Tamper test signals of varying magnitude and polarity are randomly applied to electronic sensing circuits to determine integrity of the sensing circuits. A monitor- ing circuit measures the response of the sensing circuit to the applied tamper test signals and responds to deviations from predetermined information indicative of sensing circuit integrity by generating output signals suitable for control or alarm purposes.
244204
Blair Gerard M.
Diffrient Roy S.
Hewitt William D.
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