Temperature pattern measuring method and device therefor

Details Temperature pattern measuring method and device therefor Temperature pattern measuring method and device therefor

G - Physics

01

J

354/29

G01J 5/54 (2006.01) G01K 11/12 (2006.01)

Patent

CA 1165444

ABSTRACT OF THE DISCLOSURE A temperature pattern measuring method and apparatus by which portions of light from parts of an area of an object the distribution pattern of the temperature of which is to be measured, which parts are in a predetermined pattern, are passed through first and second optical filters which pass different wavelengths of light, respectively. The level of energy passed by the re- spective filters for the respective portions of light are deter- mined by scanning the light from the filters with a pickup device or devices and using the thus determined energy levels, an arith- metic unit carries out a two-color temperature determining opera- tion for the respective parts of the area for determining the temperature on each part of the area of the object. The temper- ature pattern of the area of the object can thereby be determined from the temperatures of the parts of the area. Also, a supervision unit for the weld zone at an electrically seamed pipe, may employ the temperature pattern measuring unit of the present invention, the supervision unit producing a composite display of the form of the weld zone and the temperature pattern thereof.

371612

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