Test access apparatus

Details Test access apparatus Test access apparatus

H - Electricity

01

R

339/16, 379/2, 3

H01R 29/00 (2006.01) G01R 1/073 (2006.01) G01R 31/00 (2006.01) H04M 1/24 (2006.01)

Patent

CA 1144249

Abstract: The present invention relates to an apparatus for accessing a plurality of test points and providing electrical connection between a station and the test points. The apparatus is comprised of an insulative unit having a plurality of channels arranged in mirror-image relation to the test points. A conductive probe is disposed in each of the channels. A unit is provided for holding the insulative unit and the plurality of test points in a fixed relationship to enable the probe to contact each of the test points. Finally, a unit is provided for electrically joining the probe means to the test station.

358071

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