G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 1/04 (2006.01) H01R 13/46 (2006.01)
Patent
CA 2745740
The invention relates to a test adapter (1) for operatively connecting a chip to be tested to a test device. The test adapter has a three-dimensional construction with a baseplate (8) and a cover plate (2). The cover plate (2) has a contact array (3) having contact elements (9) coordinated with the chip to be tested in terms of number and arrangement. Arranged between the baseplate (8) and the cover plate (2) are side faces (4) which are arranged at an angle with respect to the cover plate (2) and have a number of individual connectors (5) that is coordinated with the chip to be tested.
L'invention concerne un adaptateur de test (1) permettant une connexion efficace entre une puce à tester et un dispositif de test. L'adaptateur de test présente une structure tridimensionnelle comportant une plaque inférieure (8) et une plaque supérieure (2). La plaque supérieure (2) présente un champ de contact (3) portant des éléments de contact (9) dans un nombre et un agencement adaptés à la puce à tester. Entre la plaque inférieure (8) et la plaque supérieure (2) sont agencées des surfaces latérales (4) qui sont disposées à un certain angle par rapport à la plaque supérieure (2) et qui présentent un nombre de connecteurs individuels (5) adapté à la puce à tester.
Huber+suhner Ag
Mccarthy Tetrault Llp
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