Test circuit arrangement for integrated circuit

Details Test circuit arrangement for integrated circuit Test circuit arrangement for integrated circuit

H - Electricity

01

L

356/188

H01L 21/66 (2006.01) G01R 31/317 (2006.01)

Patent

CA 1138124

1 PHD. 79-010 ABSTRACT: Integrated circuits should be tested during fabrication in order to locate faults. For this pur- pose test signals are normally applied via an additional terminal. In order to reduce the number of required additional terminals for switching circuit which is coupled to an existing terminal of the circuit and which is only activated by a logic signal of opposite polarity to that normally applied to said terminal. Via this switching circuit functional parts inside the integrated circuit are caused to go into the testing mode.

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