G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 31/28 (2006.01) H01R 12/73 (2011.01) H01R 12/82 (2011.01)
Patent
CA 2732459
A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality oftemporary mechanical and electrical connections between terminals (13 1 ) on the device under test (130) and contact pads (161) on the load board (160) The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160) In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161) In some cases, each via (151) includes a sp.pi.ng (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120)
Linvention concerne un appareil de test (120) permettant de tester électriquement un dispositif à tester (130) en formant une pluralité de connexions électriques et mécaniques temporaires entre des bornes (131) du dispositif à tester (130) et des plages de contact (161) dune carte de charge (160). Lappareil de test (120) comprend une membrane remplaçable (150) qui comporte des trous dinterconnexion (151), chaque trou dinterconnexion (151) étant associé à une borne (131) du dispositif à tester (130) et à une plage de contact (161) de la carte de charge (160). Dans certains cas, chaque trou d'interconnexion (151) comprend une paroi électroconductrice permettant de conduire le courant entre la borne (131) et la plage de contact (161). Dans certains cas, chaque trou dinterconnexion (151) comprend un ressort (152) qui applique une force de résistance mécanique sur la borne (131) lorsque le dispositif à tester (130) est en contact avec lappareil de test (120).
Alladio Patrick J.
Oberg Russell F.
Sherry Jeffrey C.
Warwick Brian
Brouillette & Associes/partners
Johnstech International
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