G - Physics – 01 – R
Patent
G - Physics
01
R
324/58
G01R 31/26 (2006.01) G01R 1/04 (2006.01)
Patent
CA 1305219
ABSTRACT A test jig for measuring the static characteristics of 3-terminal microwave active components has mechanical supports for two dielectric substrates. Two terminals of the components under test are separately connected to electrical circuits constructed on the dielectric substrates. The test jig can be adapted to the size and shape of the casing of the component under test, and allows it to be submitted to thermal tests without mechanical stresses due to expansion. The electrical circuits constructed on the dielectric substrates ensure circuit stability thus avoiding spurious oscillations during static characteristic measurements.
593370
Angelucci Angelo
Burocco Roberto
Titinet Gianni Clerico
Cselt - Centro Studi E. Laboratori Telecommunicazioni S.p.a.
Ridout & Maybee Llp
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