Test sample card

Details Test sample card Test sample card

C - Chemistry, Metallurgy

12

M

C12M 1/18 (2006.01) B01L 3/00 (2006.01) B29C 45/00 (2006.01) B29C 45/26 (2006.01) G01N 1/00 (2006.01) G01N 21/01 (2006.01) G01N 35/00 (2006.01)

Patent

CA 2176678

A test sample card has a fluid passage network provided on both sides of the card to provide for maximum separation distance between adjacent growth wells. The card also has cored sections along its periphery adjacent the wells, which improve the flow of plastic during the molding of the cards. The cored sections control the formation of knit lines in the surface of the card and eliminate knit lines from forming that could potentially bridge adjacent wells. These features, singly and together, combine to produce a card that is essentially immune to cross-talk between adjacent wells, yet permit a greater number of wells in a card of given dimensions. Improved bubble trap features are also provided for the card, including a bubble trap passage having a restriction formed therein. The restriction prevents air bubbles in the bubble trap from migrating back to the growth wells.

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