Test signal generator position cursors

Details Test signal generator position cursors Test signal generator position cursors

H - Electricity

04

N

350/1

H04N 17/00 (2006.01)

Patent

CA 2008889

- 9 - Abstract of the Disclosure A test signal generator (12) applies a test pattern to a device under test (10). The output of the device under test is displayed on a video picture monitor (16). The test signal generator inserts a cursor (13) into the test pattern, the position of the cursor within the test pattern being variable. From the cursor the test signal generator also generates a trigger signal. The trigger signal may be used to trigger the horizontal sweep of a waveform display device (14) to which the output of the device under device is input. By observing the picture monitor an operator may adjust the cursor to a position just prior to an anomaly in the displayed test pattern so that only that portion of the output waveform of the device under test in the vicinity of the cursor is displayed on the waveform display device.

Affiliated with

Also associated with

Rating

Test signal generator position cursors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test signal generator position cursors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test signal generator position cursors will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1570365