G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 11/02 (2006.01) G01N 1/28 (2006.01) G02B 21/34 (2006.01) G03F 7/00 (2006.01)
Patent
CA 2452564
A test slide for the calibration, characterization, standardization, use and study of photon and electron microscopes. The slide is created by forming patterns with specific types of geometrics on suitable substrates and these slides provide a standard for comparison of image forming capability of any type of microscope imaging system including, without limitation, light, UV, and X-ray photon micrscopical imaging systems operating in transmission or reflection modes, and other microscope techniques. Microscopists can employ one of these slides to compare images of the slide which have been produced by the microscope system under consideration with a known, accurate, image of the slide to better understand the fidelity and accuracy of the microscope system under consideration. The test patterns can also comprise reference images which can be images created by a graphic artist or the like which can be actual images of samples, these images being either two-dimensional or three-dimensional.
1192062 Alberta Limited
Richardson Technologies Inc.
Torys Llp
LandOfFree
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