Test strip reader system and method

Details Test strip reader system and method Test strip reader system and method

C - Chemistry, Metallurgy

12

M

C12M 1/34 (2006.01)

Patent

CA 2614499

A system and method is disclosed which relates to the back biasing a photodiode (Dl) and charging a capacitor (C1) to generate a pulse. The length of the pulse is proportional to the light intensity incident on the photodiode (Dl).

L'invention concerne un système et un procédé relatifs à la polarisation inverse d'une photodiode (D1) et à la charge d'un condensateur (C1) afin de générer une impulsion. La longueur de l'impulsion est proportionnelle à l'intensité de la lumière incidente sur la photodiode (D1).

Affiliated with

Also associated with

Rating

Test strip reader system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test strip reader system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test strip reader system and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1802941