G - Physics – 01 – M
Patent
G - Physics
01
M
73/169, 324/17
G01M 15/00 (2006.01) F01D 21/00 (2006.01)
Patent
CA 1158310
TEST SYSTEM FOR A DYNAMIC MACHINE Abstract of the Disclosure A control and test system for a dynamic machine utilizing condition sensors to gather information concerning machine operation. A programmed processor analyzes the information and provides control signals to actuate elements which operate the machine. The programmed processor monitors the machine operation with protective functions and shuts the machine down in the event of a serious fault. The cause of a shutdown is recorded in a nonvolatile memory. The test system has a passive mode during operation of the machine monitoring inputs from sensors and the machine operation. Intermittent and continuous faults which do not cause machine shutdown are recorded in the memory. An active test mode is performed when the machine is shut down, checking sensor circuits, machine control elements and the control and protection processor programs. Faults are recorded in the memory. The cause of a machine shutdown and other faults stored in the memory are retrieved and displayed for a serviceman.
341813
Ejzak Richard P.
Faulkner Dennis T.
Glennon Timothy F.
George H. Riches And Associates
Sundstrand Corporation
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