G - Physics – 06 – F
Patent
G - Physics
06
F
354/225
G06F 11/00 (2006.01)
Patent
CA 1124870
TESTER FOR MICROPROCESSOR-BASED SYSTEMS Abstract of the Disclosure An automatic test apparatus coupled to a bi- directional internal data and control bus of a programmed microprocessor-based system tests the performance of the system in real time. Signal responses of the bus within a known good system are compared in real time to signal responses on the bus of the unknown system under test in order to identify faults. Faults are isolated by a sequential algorithm which stops operation at the designated occurrence of a fault, typically the first fault, and thereupon traces the error causing the fault to the subsystem or components in the system under test supplying the indicated error signal to the bi-directional bus.
332882
Donn Edward S.
Lippman Michael D.
Fetherstonhaugh & Co.
Fluke (john) Mfg. Co. Inc.
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