G - Physics – 01 – N
Patent
G - Physics
01
N
73/80
G01N 3/32 (2006.01) G01N 3/56 (2006.01)
Patent
CA 1123226
Attorney's File No. 1780026 TESTING APPARATUS AND METHOD FOR MEASURING CUTTING, CHIPPING AND ABRASION RESISTANCE ABSTRACT OF THE DISCLOSURE A sample of the material to be tested is formed in a disc-shaped specimen and mounted on a spindle inserted in a mounting hole in the specimen. The spindle is rotated about a generally horizontal axis and a single blade cutter is supported above the specimen for dropping on the speci- men in cutting engagement therewith. Lifting and dropping is controlled so that there is bouncing of the cutter and repeated engagement of the cutter with the specimen between the lifting and dropping. The diameter of the test speci- men is measured before the test and after a predetermined time of the testing. The decrease in diameter is an indication of the cutting and chipping resistance of the material being tested.
325266
Goodrich (b.,f.) Company (the)
Swabey Ogilvy Renault
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