Testing of integrated circuits

Details Testing of integrated circuits Testing of integrated circuits

G - Physics

01

R

324/58.1

G01R 31/28 (2006.01) G01R 31/30 (2006.01) G01R 31/3193 (2006.01) G06F 11/277 (2006.01)

Patent

CA 1172698

ABSTRACT IMPROVEMENTS IN OR RELATING TO THE TESTING OF INTEGRATED CIRCUITS An integrated circuit is tested by applying to it the output of a clocked word generator. The resulting output from the circuit is analysed by a phase sensitive detector comprising a series of sampling switches and integrators which are synchronised with the generator frequency. The output spectrum is compared with that of a reference to evaluate the quality of the circuit.

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