Testing process for electronic devices

Details Testing process for electronic devices Testing process for electronic devices

G - Physics

01

R

356/117, 356/2

G01R 31/28 (2006.01) G01R 1/067 (2006.01)

Patent

CA 1308816

- 14 - TESTING PROCESS FOR ELECTRONIC DEVICES Abstract Electronic devices such as hybrid integrated circuits such as those having test points spaced less than 1250 µm are advantageously evaluated utilizing a two-probe process. In this process the probes are moved between test points ina pattern that reduces movement distance without concern for any ordering imposed by the nets themselves or the test to be made. Additionally, the test ismade so that the movement time is the limiting factor.

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