Testing station

Details Testing station Testing station

G - Physics

01

R

324/58.01

G01R 31/02 (2006.01)

Patent

CA 1238363

ABSTRACT TESTING STATION A station for testing one or more electric conductors (8) covered in insulating material (9) includes one or more contact probes (14) movable to pierce the insulation and contact the conductors (8). Additionally one or more contact pins (12), resiliently mounted in a mounting (11) are movable to engage and electrically connect with the exposed conductors (8) at one free end of the cable. A voltage set up between the contact probes (14) and the one or more contact pins (12) provides an indication of whether the or each probe has made an electrical connection with its respective conductor. The probes (14) are circular with a circumferential cutting edge (15). They may conveniently be moved to pierce the insulating material (9) by rotation of their mounting (16) about the axis of the conductor under the action of a cam follower (17) on a cam profile (18).

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