Testing systems and methods for a resource constrained device

Details Testing systems and methods for a resource constrained device Testing systems and methods for a resource constrained device

H - Electricity

04

W

H04W 24/00 (2009.01) G06F 11/36 (2006.01)

Patent

CA 2579662

Systems and methods for providing symbolic information about fields, methods, and/or classes for a target device. A system and method may be used where the runtime processing is split between a host system and a target system. At the target device a test program uses a symbol not defined on the target device. A query is sent from the target device to a symbolic information source. The symbolic information source then provides the target device with information about the undefined symbol. The target device uses the information from the symbolic information source to complete the test program.

L'invention concerne des systèmes et procédés permettant de fournir des informations symboliques sur des champs, des procédés et/ou des classes par rapport à un dispositif cible. On peut utiliser un système et un procédé lorsque le traitement d'exécution est divisé entre un système hôte et un système cible. Au niveau du dispositif cible, un programme d'essais utilise un symbole non défini sur ledit dispositif cible. Le dispositif cible envoie une interrogation à une source d'informations symboliques. Cette dernière fournit alors au dispositif cible des informations sur le symbole indéfini. Le dispositif cible utilise les informations provenant de la source d'informations symboliques pour compléter le programme d'essais.

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