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G01L 1/26 (2006.01) G01B 5/00 (2006.01) G01B 7/24 (2006.01) G01D 5/22 (2006.01)
Patent
CA 1201904
ABSTRACT OF THE DISCLOSURE A temperature compensated measuring system for measuring linear deformation due to the application of force. Electrical signals produced by a pair of bimetal thermal de- tectors utilizing a pair of linear variable differential transformers are electrically summed to provide a signal free of thermal influence Parallel rods of diverse metals are interconnected through one LVDT while a portion of one of the rods is connected to the member to be measured by the other LVDT and the summation of electrical signals permits an electrical thermally compensated readout indicating defor- mation due to force.
439064
Acer Automation Company
Borden Ladner Gervais Llp
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