Thermal imaging method and apparatus

Details Thermal imaging method and apparatus Thermal imaging method and apparatus

G - Physics

01

N

G01N 21/88 (2006.01) F01D 25/00 (2006.01) F02C 7/00 (2006.01)

Patent

CA 2546524

An inspection apparatus includes a light source positioned to direct light to a first surface of a workpiece. An infrared detector is positioned to receive radiation from the first surface. A data acquisition and processing computer is coupled to the light source and the infrared detector. The computer triggers the light source to emit the light a number of instances. The computer acquires thermal data from the infrared detector for a number of times after each of the instances. The computer is configured to process the data using a theoretical solution to analyze the thermal data based upon an average of the thermal data for a number of each of corresponding ones of the times from different ones of the instances.

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