Thermometry probe calibration method

G - Physics – 01 – K

Patent

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G01K 7/42 (2006.01) G01K 15/00 (2006.01)

Patent

CA 2502019

A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.

L'invention concerne un procédé dans lequel des différences de masse thermique et de fabrication sont compensées dans des sondes thermométriques par stockage de données caractéristiques relatives à des sondes individuelles dans une mémoire EEPROM pour chaque sonde, laquelle est utilisée par l'appareil de température.

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