G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/06 (2006.01)
Patent
CA 2053839
ABSTRACT In a thickness-measuring instrument (1), in order to determine vertical movement deviations (a1, a2, x1, x2) of the measuring heads (3, 4) a source of laser light (7) is incorporated, the beam (8) of which strikes a detector (10) that determines said deviations. (Figure 2)
Eberline Instruments Gmbh
Fetherstonhaugh & Co.
LandOfFree
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