Thickness/density measuring apparatus

Details Thickness/density measuring apparatus Thickness/density measuring apparatus

G - Physics

01

B

358/6

G01B 15/02 (2006.01) G01N 23/16 (2006.01) G01N 23/203 (2006.01) G01N 9/24 (2006.01) G01N 33/44 (2006.01)

Patent

CA 1307056

Abstract of the Disclosure A low-voltage, compact thickness/density measuring apparatus is disclosed which uses a PIN diode in conjunction with a low noise processing circuit to detect particle radiation emitted from a source, which source has its detection intensity affected by a material to be measured. A light blocking, part- icle radiation permeable material protects the PIN diode from detecting light radiation. A system for controlling the extru- sion of a film using the measuring apparatus is also disclosed.

562888

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