Thickness/density measuring apparatus

Details Thickness/density measuring apparatus Thickness/density measuring apparatus

G - Physics

01

B

358/6, 358/7

G01B 15/02 (2006.01) G01N 9/24 (2006.01) G05D 5/03 (2006.01)

Patent

CA 2014893

ABSTRACT OF THE DISCLOSURE A low-voltage, compact measuring apparatus for measuring any one of thickness, density and denier of a material is disclosed which uses a PIN diode in conjunction with a low noise processing circuit to detect particle radiation emitted from a source, which source has its detection intensity affected by a material to be measured. A light blocking, particle radiation permeable material protects the PIN diode from detecting light radiation. A system for controlling the extrusion of a film using the measuring apparatus, and for correcting for erroneous measurement caused by web flutter, are also disclosed.

Affiliated with

Also associated with

Rating

Thickness/density measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thickness/density measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thickness/density measuring apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1975447