Thin-film magnetic recording heads and systems and methods...

Details Thin-film magnetic recording heads and systems and methods... Thin-film magnetic recording heads and systems and methods...

G - Physics

11

B

G11B 5/31 (2006.01) G11B 5/187 (2006.01) G11B 5/39 (2006.01) H01J 37/305 (2006.01)

Patent

CA 2252979

In one embodiment, the invention is understood as a focused particle beam system (10) that includes a pattern recognition element (54) and that employs the pattern recognition element to image and analyze the pole-tip assembly (100) footprint (114A, 114B, 114C) of a recording head and that employs a processor (52) to generate instruction signals that direct a focused particle beam (20) to remove selected portions of the recording head (30) and thereby shape the pole-tip assembly of the recording head. The focused particle beam system provides a precision milling device that can employ the coordinate information to mill selectively the recording head and thereby shape the geometry of the pole-tip assembly footrint, including geometries that have contoured surfaces.

Dans un mode de réalisation, l'invention porte sur un système à faisceau de particules focalisé (10) comportant un élément de reconnaissance des formes (54) et utilisant ce dernier pour former une image d'une surface de contact (114A, 114B, 114C) d'un ensemble à cornes polaires (100) d'une tête enregistreuse et l'analyser. Le système utilise également un processeur (52) pour produire des signaux d'instructions ayant pour but de faire enlever par le faisceau de particules focalisé (20) des parties sélectionnées de la tête enregistreuse (30) et, partant, de façonner l'ensemble à cornes polaires de la tête enregistreuse. Ce système à faisceau de particules focalisé constitue un dispositif rectifieur de précision faisant usage d'une information de coordination pour rectifier sélectivement la tête enregistreuse et, par le fait, définir la géométrie de l'ensemble à cornes polaires, notamment les formes que revêtent les surfaces profilées.

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