G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 9/02 (2006.01) G01L 1/24 (2006.01)
Patent
CA 2341166
The invention relates to polymeric/semiconductor thin film strain gauges comprising visible light from spectrometer (10) which is directed onto a thin film passive sensor (12) having a transparent glass substrate (14) and a laminated construction in succession from the substrate (14), of a polyimide layer (18a), a polysiloxane layer (16a) filled with alumina particles, a polyimide layer (18b) and a polysiloxane layer (16b) filled with alumina particles.
L'invention a trait à des jauges de contrainte à film mince polymères/semi-conductrices. De la lumière visible provenant d'un spectromètre (10) est dirigée sur un capteur (12) passif à film mince comportant un substrat (14) de verre transparent et une construction stratifiée qui présente successivement à partir du substrat (14) une couche (18a) de polyimide, une couche (16a) de polysiloxane remplie de particules d'alumine, une couche (18b) de polyimide et une couche (16b) de polysiloxane remplie de particules d'alumine.
Euler William B.
Gregory Otto J.
Huston Gregg C.
Borden Ladner Gervais Llp
The Board Of Governors For Higher Education State Of Rhode Island And P. Rovidence Plantations
LandOfFree
Thin film strain sensors based on interferometric optical... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thin film strain sensors based on interferometric optical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film strain sensors based on interferometric optical... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1344040