Three-dimensional measuring apparatus

Details Three-dimensional measuring apparatus Three-dimensional measuring apparatus

G - Physics

01

B

G01B 11/00 (2006.01) G01B 11/24 (2006.01) G01B 11/25 (2006.01) G01S 17/89 (2006.01)

Patent

CA 2044820

In a three-dimensional measuring apparatus, a multi-slit projector comprises an actuator (46) for displacing at least one of first and second diffraction gratings (42,43) by only a minute distance in a direction perpendicular to the slit lights, and an image recognizing apparatus comprises an image arithmetic unit (105) for changing, each time a coded multi-slit light pattern is changed, weights assigned to the binarized image signals, and for summing up the last weighted binarized image signals or the image signals of the last added results read out from an image memory (44), with newly weighted binarized image signals, whereby the image resolution is improved, the memory capacity is reduced and the processing speed is increased.

Dans un appareil de mesure à trois dimensions, un projecteur multi-fentes comprend un actionneur (46) permettant de déplacer au moins l'un de deux réseaux de diffraction (42, 43) sur une toute petite distance dans une direction perpendiculaire aux lumières des fentes, et un appareil de reconnaissance d'image comprend une unité arithmétique d'image (105) servant à changer, chaque fois qu'un profil de lumière multi-fentes codé est changé, les poids affectés aux signaux d'image binarisés, et à mettre en sommation les derniers signaux d'image binarisés pondérés ou les signaux d'image des derniers résultats ajoutés lus dans une mémoire vidéo (44), avec les nouveaux signaux d'image binarisés pondérés, ce qui permet d'améliorer la résolution de l'image, de réduire la capacité de mémoire et d'accroître la vitesse de traitement.

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