Tip attachment for circuit tester probe

Details Tip attachment for circuit tester probe Tip attachment for circuit tester probe

H - Electricity

01

R

324/58.3

H01R 11/18 (2006.01)

Patent

CA 1323068

ADOLPH FODALI S&G-3 TIP ATTACHMENT FOR CIRCUIT TESTER PROBE ABSTRACT OF THE DISCLOSURE The attachment consists of a single length of resilient wire formed into a coil spring portion, a probe engaging portion and an elongated tip portion. The tip portion extends forwardly from the coil spring portion in a direction generally parallel to the probe and has a uniform cross-sectional dimension throughout its length. A radially extending portion of the wire is bent to form a recess adapted to engage the insulated wire of the probe, so as to retain the attachment when not in use.

600163

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