Total reflection x-ray fluorescence apparatus

Details Total reflection x-ray fluorescence apparatus Total reflection x-ray fluorescence apparatus

G - Physics

01

N

358/12

G01N 23/223 (2006.01) G01N 23/22 (2006.01)

Patent

CA 2028003

A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as an SSD for detecting fluorescent X-rays emerging from a specimen located near the optically flat surface of the base material and a second detector such as a scintillation counter for detecting an intensity of an X-rays coming from the base material.

Appareil de fluorescence X à réflexion totale, comprenant un matériau de base ayant une surface optique plate pour assurer la réflexion totale d'une attaque en incidence rasante, un premier détecteur, par exemple une DSS pour détecter les rayons X qui émergent d'un échantillon situé près de la surface optique plate du matériau de base, et un deuxième détecteur, par exemple un compteur de scintillement pour détecter l'intensité de rayons X provenant du matériau de base.

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