Two-dimensional imaging backscatter probe

Details Two-dimensional imaging backscatter probe Two-dimensional imaging backscatter probe

G - Physics

01

N

G01N 23/203 (2006.01)

Patent

CA 2250279

A two-dimensional imaging backscatter probe (12) has a radiation source (20), a radiation detector (22), and a position sensing device (24) to which the radiation detector is attached. A mapping circuit generates a two-dimensional map of backscattered radiation as a function of position of the radiation detector. A display (44) displays the two-dimensional map. The two-dimensional imaging backscatter probe of the present invention facilitates non- destructive/non-intrusive inspection of a test article for contraband and/or structural integrity inspection.

Cette sonde (12) de rétrodiffusion d'imagerie bidimensionnelle présente une source de rayons (20), un détecteur de rayons (22) ainsi qu'un capteur de position (24) auquel est fixé le détecteur de rayons. Un circuit de mappage produit une carte bidimensionnelle des rayons rétrodiffusés en tant que fonction de position du détecteur de rayons. Un affichage (44) visualise la carte bidimensionnelle. La sonde de rétrodiffusion d'imagerie bidimensionnelle de l'invention facilite une inspection, non destructive/non pénétrante d'un article, visant à déterminer l'intégrité structurelle de l'article et/ou la contenance par celui-ci d'un objet de contrebande.

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