Ultrasonic inspection with back echo monitoring

Details Ultrasonic inspection with back echo monitoring Ultrasonic inspection with back echo monitoring

G - Physics

01

N

349/42

G01N 29/04 (2006.01) G01N 29/11 (2006.01) G01N 29/36 (2006.01) G01N 29/38 (2006.01)

Patent

CA 1161941

Abstract Method and apparatus for ultrasonic non-destructive testing by the pulse echo method. The pulses received from flaws in a test object are supplied to a main branch circuit for amplification to produce a suitable flaw display and to a back echo branch circuit having a lower amplification such that the back echo signal does not saturate the amplifier. During a "flaw gate" period, the output from the main branch circuit is supplied through a high speed electronic switch to a display. At the conclusion of the flaw gate period, the switch is actuated to supply the back echo branch circuit output to the display. In this manner, the back echo signal may be monitored for additional flaw information.

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