Variable temperature scanning tunneling microscope

Details Variable temperature scanning tunneling microscope Variable temperature scanning tunneling microscope

H - Electricity

01

J

358/10.1

H01J 37/26 (2006.01) H01J 37/28 (2006.01)

Patent

CA 1312681

A Variable Temperature Scanning Tunneling Microsope ABSTRACT A themally compensated tube scanner scanning tunneling microscope utilizes two concentric piezoelectric tubes, one for scanning and one for coarse translation as well as fine adjustment of sample position while in tunneling range. There are no mechanical components such as springs, levers, gears, or stepper motors which are known to result in considerable vibration sensitivity and thermal drift. Consequently, the standard mode of atomic resolution operation for the device is without vibration isolation and with a thermal drift of less than 1 angstrom per hour.

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