G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 21/88 (2006.01) G01N 21/89 (2006.01)
Patent
CA 2646818
A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated.
Selon l'invention, une matière grossière déposée sur un substrat au cours de la fabrication d'un article composite est inspectée par un système incorporant un ensemble de vision. L'ensemble de vision comprend une source de lumière surfacique, un générateur de raie, un capteur et un processeur d'images. La source de lumière surfacique illumine une surface de la matière grossière. Le générateur de raie génère une raie d'illumination en travers de la surface. Le capteur saisit une image de la surface. Le processeur d'images analyse l'image obtenue. Le processeur d'images est conçu pour identifier des débris sur la matière grossière suite à l'activation de la source de lumière surfacique et pour identifier des anomalies de placement suite à l'activation du générateur de raie.
Engelbart Roger W.
Hannebaum Reed
Orr Sam
Pollock Tim
Sim & Mcburney
The Boeing Company
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