H - Electricity – 03 – K
Patent
H - Electricity
03
K
354/134
H03K 5/22 (2006.01) G06F 7/02 (2006.01) G06K 9/03 (2006.01) G07F 7/08 (2006.01)
Patent
CA 1188812
-38- WAVEFORM MATCHING SYSTEM AND METHOD Abstract of the Disclosure A method and system of matching first and second waveforms, each having identifiable features, for identification purposes, are disclosed. The method includes the steps of obtaining from the first waveforms significant said identifiable features having values and locations with respect to a starting point of the asso- ciated said first waveform, with the significant iden- tifiable features being obtained according to predeter- mined criteria; utilizing values and locations of the significant identifiable features of a first waveform to search in predetermined locations for anticipated corres- ponding identifiable features in a second waveform; determining the values and locations of the identifiable features, if any, found in the predetermined locations; and comparing the values and locations from the deter- mining step with the values and locations of the sig- nificant identifiable features of a first waveform according to second predetermined criteria to determine whether or not the second waveform matches a first waveform. The system includes a data acquisition module for obtaining the significant identifiable features mentioned, and a matching module for utilizing the significant identifiable features of the first waveforms to effect the comparing step mentioned.
438037
Akister James F.
Ma Hung S.
Nally Robert B.
LandOfFree
Waveform matching system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Waveform matching system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Waveform matching system and method will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1205760