G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 23/00 (2006.01) G01J 11/00 (2006.01) G01R 13/34 (2006.01) G01R 19/25 (2006.01)
Patent
CA 2356403
A reference signal generation portion generates a reference signal independently of a repetition cycle of a signal under test. A frequency measuring portion measures a repetition frequency of the signal under test by using a reference signal from the reference signal generation portion. A sampling frequency setting portion computes and sets a value of frequency of a sampling signal which can obtain a desired delay time with respect to a phase of the signal under test based on a value of a repetition frequency measured with the frequency measuring portion. The sampling signal generation portion uses a reference signal from the reference signal generation portion and the value of the frequency set by the sampling frequency setting portion to generate a sampling signal having a cycle corresponding to the frequency.
Otani Akihito
Otsubo Toshinobu
Watanabe Hiroto
Anritsu Corporation
Gowling Lafleur Henderson Llp
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