Waveform measuring apparatus

Details Waveform measuring apparatus Waveform measuring apparatus

Category

G - Physics

Subcategory

01

Subsubcategory

R

IPC codes

G01R 23/12 (2006.01) G01R 13/34 (2006.01)

Type

Patent

Patent number

CA 2354939

Description

A frequency synthesized signal generator outputs a frequency synthesized signal having a frequency equal to a repetition frequency of a signal under test by employing a reference signal. A phase comparator detects a phase difference between a phase of the frequency synthesized signal and a phase of the signal under test, and outputs a phase difference signal. A voltage control oscillator generates a reference signal phase-synchronized with the signal under test based on the phase difference signal output from the phase comparator, and feeds the reference signal back to the frequency synthesized signal generator. A sampling signal generator circuit generates a sampling signal applied to a sampling section by employing the reference signal output from the voltage control oscillator.

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