Waveform measuring method and apparatus

G - Physics – 01 – R

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Details

G01R 23/00 (2006.01) G01R 13/00 (2006.01) G01R 13/34 (2006.01)

Patent

CA 2356406

A common reference signal is applied from the same reference signal generating portion to a reference signal input terminal of a signal under test generator and a reference signal input terminal of a sampling signal generator circuit. A sampling frequency is set to the sampling signal generator circuit such that a desired delay time can be obtained relevant to a phase of a signal under test. In the sampling signal generator circuit, the sampling signal having a cycle that corresponds to the sampling frequency is generated based on the common reference signal and the sampling frequency. A repetition cycle of the signal under test and a repetition cycle of the sampling signal are set based on a cycle of the common reference signal so that the repetition cycle of the sampling signal can be set independently of the repetition cycle of the signal under test.

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