G - Physics – 01 – J
Patent
G - Physics
01
J
73/55
G01J 9/02 (2006.01) G01J 3/26 (2006.01)
Patent
CA 2033194
ABSTRACT The present invention provides a wavelength detecting apparatus for detecting the wavelength of a light (11) to be detected with reference to a reference light (31) by allowing the reference light (31) generated and transmitted from a light source (30) and the light (11) to be detected to be irradiated toward an etalon (62) and then detecting the light which has permeated through the etalon (62) by optical detecting means (64). The reference light and the light to be detected are incident on the focusing surface (50) which is located in front of a collimeter lens (61). The incident light is transformed into a parallel light in the collimeter lens (61) and the parallel light is then irradiated toward the etalon (62). The reference light and the light to be detected both of which have permeated through the etalon (62) reach the detecting surface of the optical detecting means to build their images thereon with the aid of image building lens means (63), whereby interference fringes corresponding to the reference light and the light to be detected are formed on the detecting surface of the optical detecting means. The optical detecting means detects a relative wavelength of the light to be detected relative to the reference light, i.e., an absolute wavelength of the light to be detected by detecting the interference fringes.
Kobayashi Yukio
Kowaka Masahiko
Wakabayashi Osamu
Kabushiki Kaisha Komatsu Seisakusho
Kobayashi Yukio
Kowaka Masahiko
Moffat & Co.
Wakabayashi Osamu
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