X-ray analysis apparatus comprising a deflection system

Details X-ray analysis apparatus comprising a deflection system X-ray analysis apparatus comprising a deflection system

G - Physics

01

N

358/5

G01N 23/207 (2006.01)

Patent

CA 1237830

PHN 10.844 28.10.1984 ABSTRACT: "X-ray analysis apparatus comprising a deflection system". In order to prevent disturbing effects on the measurement signal resulting from the detection of ex- traneous charged particles by the detector in an X-ray analysis apparatus, a collimating element for the X-ray beam is arranged in front of the detector and provided with a deflection system for charged particles. When the de- flection system is made of permanent magnetic material which is arranged near or in a collimator, the construction of the apparatus need not be further modified. Such a de- flection system is shielded so that no disturbing fields can occur near the specimen, in the X-ray source, or in the detector,

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