G - Physics – 01 – N
Patent
G - Physics
01
N
358/11.4
G01N 23/207 (2006.01) G01N 23/20 (2006.01)
Patent
CA 1208813
ABSTRACT: X-ray analysis apparatus with an adjustable stray ra- diation slit. In an X-ray analysis apparatus, there is pro- vided between a test specimen (5) or an analysing crys- tal and a detector (9) a stray radiation slit (15) that can be adjusted in dependence on the goniometer angle. By an optimum adjustment of this slit in correspondence with the variation in the goniometer angle it can be achieved that the detector will always see the same por- tion of the surface of the test sample or analysing crys- tal. Especially, the adjustment of the slit is coupled to the adjustment of an automatic divergence slit (11) so that the portion of the surface which is irradiated, remains unaltered. Especially for small goniometer angles, that is to say for the analysis of a substance in which there is a large distance between crystal planes, a considerably improved signal-to-noise ratio in the measurement signal is thus obtained.
424412
Koninklijke Philips Electronics N.v.
Van Steinburg C.e.
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