G - Physics – 01 – N
Patent
G - Physics
01
N
358/11.4
G01N 23/205 (2006.01) H05G 1/02 (2006.01)
Patent
CA 1151779
ABSTRACT The present invention relates to cameras for X-ray diffraction analysis of crystalline samples to determine lattice parameters of a sample. More particularly the invention relates to an X-ray diffraction camera having a hypocycloidal gear train adapted to cause rotation of the sample within the camera about two generally normal axes. Prior art devices do not provide for the rotation of samples about two or more axes, therefore a preferred camera according to the invention comprises/ a sample mounting including a sample support to position the sample at a pre- determined location, means to receive and support a film, means to direct x-rays at the sample so that scattered rays leaving said sample expose the film, and drive means to rotate the sample about two generally normal axes inter- secting at that location. The drive means includes a hypocycloidal gear train having a base gear to which the mounting is attached, the base gear being rotatable about one of the specified axes, and a planetary gear meshingly engaged with the base gear and wherein the sample support is coupled to the planetary gear so as to be rotated about the other axis.
370075
Commonwealth Of Australia
Dunsmuir George H.
LandOfFree
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