X-ray examination apparatus having a double focusing crystal

Details X-ray examination apparatus having a double focusing crystal X-ray examination apparatus having a double focusing crystal

G - Physics

01

N

358/27

G01N 23/207 (2006.01)

Patent

CA 1222075

11 ABSTRACT: X-ray examination apparatus having a double focusing crystal. A double focusing monochromator crystal for an X-ray analysis apparatus is formed from a single crystal of silicon or germanium poor in dislocations, in which at a surface coinciding with one of the crystal surfaces of the crystal a cavity is provided. With the accurately finished opposite surface the crystal is preferably secured in a cavity of the jig by means of a glue compound or with the interposition of a metal layer by soldering. More particularly, the cavities are spherical and the ultimate radius of curvature of the crystal is distributed uniformly over the cavity in the crystal and the cavity in the jig.

446511

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