X-ray examination system and method of controlling an...

Details X-ray examination system and method of controlling an... X-ray examination system and method of controlling an...

H - Electricity

05

G

358/11.2

H05G 1/46 (2006.01) H04N 5/32 (2006.01) H05G 1/44 (2006.01)

Patent

CA 1262191

ABSTRACT: An x-ray examination system comprising an x-ray generator, an image intensifier tube connected to an output optical path and an x-ray exposure control arrangement which measures the light image intensity LI at the output of the image intensifier during fluoroscope, and from the relationship Image derives the exposure value IEXP1 of the switch-on tube current required to provide a desired exposure density during subsequent fluorography with a tube voltage VFL and exposure time TEXP, and wherein LA is a predetermined constant.

507477

Affiliated with

Also associated with

Rating

X-ray examination system and method of controlling an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray examination system and method of controlling an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray examination system and method of controlling an... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1190987