X-ray examining device

Details X-ray examining device X-ray examining device

H - Electricity

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358/11

H05G 1/02 (2006.01) A61B 6/02 (2006.01) A61B 6/06 (2006.01) G21K 1/04 (2006.01)

Patent

CA 1070439

ABSTRACT: An X-ray examining device comprises an aperture consisting of sector-like laminations instead of a commonly used iris aperture. The laminations are rotatable about axes perpendicularly to the main axis of the beam to be stopped, and the sides of the lamina- tions are adapted to the optical system so that proper imaging is maintained also in the case of a comparatively small passage opening of the aperture.

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