X-ray fluorescence measuring system making use of polarized...

Details X-ray fluorescence measuring system making use of polarized... X-ray fluorescence measuring system making use of polarized...

H - Electricity

01

J

H01J 35/06 (2006.01) G01N 23/223 (2006.01) H01J 35/02 (2006.01) H05G 1/02 (2006.01)

Patent

CA 2241640

The invention relates to X-ray fluorescence measuring systems, more specifically to methods for producing polarized X-radiation. The invention is based on the idea of using beryllium as the anode material despite its poor effectiveness. Some of the X- radiation spectrum produced by a beryllium anode is polarized radiation, morespecifically its high-energy portion. The system of the invention involves filtering out the low-energy portion of the spectrum, whereby the remaining intensely polarized radiation can be used as excitation radiation in X-ray fluorescence measurements. The system of the invention is capable of achieving a certain intensity of polarized X- radiation by means of an X-ray tube less powerful than those used in common prior art solutions based on the use of scattering media.

Cette invention concerne des systèmes de mesure par fluorescence X, plus spécifiquement des méthodes pour produire une radiation X polarisée. Cette invention est basée sur l'utilisation du béryllium comme matière anodique, en dépit de sa faible efficacité. Une partie du rayonnement X produit par une anode de béryllium est polarisée, plus spécifiquement la partie des hautes énergies. Le système divulgué fait intervenir un filtrage de la partie du rayonnement ayant l'énergie la plus faible, et l'utilisation de la partie restante, intensément polarisée, comme source d'excitation pour des mesures de fluorescence X. Ce système est capable de produire une certaine intensité de rayonnement X polarisé au moyen d'un tube à rayons X moins puissant que ceux utilisés jusqu'à présent dans les systèmes utilisant un milieu diffusant.

Affiliated with

Also associated with

Rating

X-ray fluorescence measuring system making use of polarized... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray fluorescence measuring system making use of polarized..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray fluorescence measuring system making use of polarized... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1981314