X-ray fluorescent analysis with matrix compensation

Details X-ray fluorescent analysis with matrix compensation X-ray fluorescent analysis with matrix compensation

G - Physics

01

N

358/12

G01N 23/223 (2006.01)

Patent

CA 1163381

ABSTRACT A new X-ray fluorescence method for testing a sample having two essentially parallel planar faces that provides full matrix effect compensation is disclosed. The intensities of the transmitted and fluorescent beams of photons are measured by X-ray detectors, and the X-ray source and the two detectors are operated so that Image ? Image where ? is the angle of the primary beam to one face of the sample, ? is the angle of the fluorescent beam to either face of the sample, E1 is the energy of the photons of the primary beam, and E2 is the characteristic electron orbital transition energy for the element of interest. From the ratio of the two intensities the mean average concentration of the element is calculated directly without iterative or other complex procedures.

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