X-ray interferometer for phase contrast imaging

Details X-ray interferometer for phase contrast imaging X-ray interferometer for phase contrast imaging

G - Physics

01

N

G01N 23/00 (2006.01)

Patent

CA 2657600

The present invention relates to an interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, comprising: a) an x-ray source, preferably a standard polly chromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase- stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.

Interféromètre aux rayons x, en particulier rayons X durs, donnant des images aux rayons X quantitatives d'un objet, qui comprend: a) source de rayons X, de préférence polychromatique, b) réseau diviseur de faisceau en diffraction autre que cristal de Bragg, de préférence en géométrie de transmission, c) détecteur sensible à la position à sensibilité de détection à modulation spatiale ayant un nombre de pixels individuels; d) enregistreur des images du détecteur en mode à échelonnement de phase; et e) évaluateur d'intensité pour chaque pixel dans une série d'images pour identifier la caractéristique de l'objet pour chaque pixel individuel en tant que pixel à dominante d'absorption et/ou pixel à dominante de contraste de phase différentiel et/ou pixel à dominante de diffusion des rayons X.

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